{"product_id":"advanced-mos-devices-and-their-circuit-applications-9781032392851","title":"Advanced MOS Devices and their Circuit Applications","description":"\u003cp\u003e\u003c\/p\u003e\u003cblockquote\u003e\n\u003cbr\u003eThis book discusses advanced MOS devices and their circuit applications with reliability concerns, focusing on energy-efficient Tunnel FET-based circuit applications. It covers MOS devices, materials, and semiconductor transistor technologies for ultra-low-power applications, biosensing, and reliability design. It includes research problem statements, simulations, and coverage of novel MOS devices. \u003c\/blockquote\u003e\u003cp\u003e\u003cstrong\u003eFormat\u003c\/strong\u003e: Hardback\u003cbr\u003e\u003cstrong\u003eLength\u003c\/strong\u003e: 146 pages\u003cbr\u003e\u003cstrong\u003ePublication date\u003c\/strong\u003e: 08 January 2024\u003cbr\u003e\u003cstrong\u003ePublisher\u003c\/strong\u003e: Taylor \u0026amp; Francis Ltd\u003cbr\u003e\u003c\/p\u003e \u003cp\u003e\u003cbr\u003eThis comprehensive text delves into the realm of advanced MOS devices and their diverse circuit applications, while also addressing crucial reliability concerns. It explores the utilization of MOS transistors in various energy-efficient systems on chips (SoCs), highlighting their role in next-generation ultra-low-power applications. The book provides a detailed examination of MOS devices, materials, and related semiconductor transistor technologies, aiming to pave the way for future advancements in the field.\u003cbr\u003e\u003cbr\u003eFurthermore, it delves into the realm of biosensing circuit applications, utilizing field-effect transistors, and addresses reliability design considerations and compact modeling techniques. The appendix includes research problem statements with specifications and commercially available industry data, enhancing the practicality of the material.\u003cbr\u003e\u003cbr\u003eThe volume encompasses detailed discussions on DC and analog\/RF characteristics, the impact of trap-assisted tunneling (TAT) on reliability analysis, spacer-underlap engineering methodologies, dopant profile analysis, and work-function techniques. It also covers novel MOS devices such as FinFET, Graphene field-effect transistors, Tunnel FETS, and Flash memory devices. This book serves as an invaluable resource for senior undergraduate students, graduate students, and academic researchers in the fields of electrical engineering, electronics and communication engineering, computer engineering, materials science, nanoscience, and nanotechnology.\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eWeight\u003c\/strong\u003e: 453g\u003cbr\u003e\u003cstrong\u003eDimension\u003c\/strong\u003e: 234 x 156 (mm)\u003cbr\u003e\u003cstrong\u003eISBN-13\u003c\/strong\u003e: 9781032392851\u003c\/p\u003e","brand":"Shulph Ink","offers":[{"title":"Hardback","offer_id":45217004814586,"sku":"9781032392851","price":99.96,"currency_code":"GBP","in_stock":true}],"url":"https:\/\/shulphink.com\/products\/advanced-mos-devices-and-their-circuit-applications-9781032392851","provider":"Shulph Ink","version":"1.0","type":"link"}