{"product_id":"design-for-testability-debug-and-reliability-next-generation-measures-using-formal-techniques-9783030692117","title":"Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques","description":"\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cblockquote\u003eThis book provides novel approaches to design for testability,debug,and reliability,using formal techniques such as SAT and BMC,to address the increasing challenges in state-of-the-art circuit designs. It combines these methods into a common framework with standardized software\/hardware interfaces. \u003c\/blockquote\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eFormat\u003c\/strong\u003e: Paperback \/ softback\u003cbr\u003e\u003cstrong\u003eLength\u003c\/strong\u003e: 164 pages\u003cbr\u003e\u003cstrong\u003ePublication date\u003c\/strong\u003e: 20 April 2022\u003cbr\u003e\u003cstrong\u003ePublisher\u003c\/strong\u003e: Springer Nature Switzerland AG\u003cbr\u003e\u003c\/p\u003e\u003cp\u003e\u003cbr\u003eThis comprehensive book delves into groundbreaking approaches to pave the way for the next generation of integrated circuits, ensuring their successful and reliable integration, even in safety-critical applications. The authors present innovative solutions to tackle the escalating challenges in design for testability, debug, and reliability, essential requirements for state-of-the-art circuit designs. By leveraging formal techniques like Satisfiability (SAT) problem and Bounded Model Checking (BMC), the book addresses the growing concerns related to the increasing volume of test data, test application time, and the demand for enhanced reliability. Thorough discussions and extensive evaluations of these methods are provided, considering industry-relevant benchmark candidates. All measures are seamlessly integrated into a unified framework, implementing standardized software\/hardware interfaces.\u003cbr\u003e\u003cbr\u003eThis groundbreaking book explores innovative approaches to pave the way for the next generation of integrated circuits, ensuring their successful and reliable integration, even in safety-critical applications. The authors present groundbreaking solutions to tackle the escalating challenges in design for testability, debug, and reliability, essential requirements for state-of-the-art circuit designs. By leveraging formal techniques like Satisfiability (SAT) problem and Bounded Model Checking (BMC), the book addresses the growing concerns related to the increasing volume of test data, test application time, and the demand for enhanced reliability. Thorough discussions and extensive evaluations of these methods are provided, considering industry-relevant benchmark candidates. All measures are seamlessly integrated into a unified framework, implementing standardized software\/hardware interfaces.\u003cbr\u003e\u003cbr\u003eThis comprehensive book delves into groundbreaking approaches to pave the way for the next generation of integrated circuits, ensuring their successful and reliable integration, even in safety-critical applications. The authors present innovative solutions to tackle the escalating challenges in design for testability, debug, and reliability, essential requirements for state-of-the-art circuit designs. By leveraging formal techniques like Satisfiability (SAT) problem and Bounded Model Checking (BMC), the book addresses the growing concerns related to the increasing volume of test data, test application time, and the demand for enhanced reliability. Thorough discussions and extensive evaluations of these methods are provided, considering industry-relevant benchmark candidates. All measures are seamlessly integrated into a unified framework, implementing standardized software\/hardware interfaces.\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eWeight\u003c\/strong\u003e: 296g\u003cbr\u003e\u003cstrong\u003eDimension\u003c\/strong\u003e: 235 x 155 (mm)\u003cbr\u003e\u003cstrong\u003eISBN-13\u003c\/strong\u003e: 9783030692117\u003cbr\u003e \u003cstrong\u003eEdition number\u003c\/strong\u003e: 1st ed. 2021\u003c\/p\u003e","brand":"Sebastian Huhn,Rolf Drechsler","offers":[{"title":"Paperback \/ softback","offer_id":44102911688954,"sku":"9783030692117","price":85.39,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0522\/4297\/2845\/products\/noImage_1_51d20f4f-dde4-417c-802b-1e2ffcb82c5c.jpg?v=1669650740","url":"https:\/\/shulphink.com\/products\/design-for-testability-debug-and-reliability-next-generation-measures-using-formal-techniques-9783030692117","provider":"Shulph Ink","version":"1.0","type":"link"}