{"product_id":"multigigahertz-nyquist-analogtodigital-converters-architecture-and-circuit-innovations-in-deepscaled-cmos-and-finfet-technologies-9783031227080","title":"Multi-Gigahertz Nyquist Analog-to-Digital Converters: Architecture and Circuit Innovations in Deep-Scaled CMOS and FinFET Technologies","description":"\u003cp\u003e\u003c\/p\u003e\u003cblockquote\u003e\n\u003cbr\u003eThis book proposes innovative circuit, architecture, and system solutions in deep-scaled CMOS and FinFET technologies to maximize the accuracy*speed\/power of multi-GHz sample rate and bandwidth Analog-to-Digital Converters (ADC)s. It introduces a holistic approach to identify error sources and analyze their impact on overall performance, establishing circuit-imposed accuracy, speed, and power limits. The analysis extends to architecture level, comparing ADC architectures and variants. Time-interleaving is covered, and a framework is introduced to compare key metrics of interleaver architectures. The impact of technology is considered by adding process effects from several deep-scaled CMOS technologies. The validity of the approach is demonstrated by four silicon prototype ICs realized in ultra-deep-scaled CMOS and FinFET technologies. \u003c\/blockquote\u003e\u003cp\u003e\u003cstrong\u003eFormat\u003c\/strong\u003e: Hardback\u003cbr\u003e\u003cstrong\u003eLength\u003c\/strong\u003e: 269 pages\u003cbr\u003e\u003cstrong\u003ePublication date\u003c\/strong\u003e: 13 January 2023\u003cbr\u003e\u003cstrong\u003ePublisher\u003c\/strong\u003e: Springer International Publishing AG\u003cbr\u003e\u003c\/p\u003e \u003cp\u003e\u003cbr\u003eThis book presents cutting-edge circuit, architecture, and system solutions in deep-scaled CMOS and FinFET technologies, aimed at addressing the challenges in maximizing the accuracy, speed, and power of multi-GHz sample rate and bandwidth Analog-to-Digital Converters (ADC). A novel holistic approach is introduced, which first identifies the primary error sources of converter building blocks and quantitatively analyzes their impact on the overall performance, establishing the fundamental circuit-imposed accuracy, speed, and power limits. The analysis extends to the architecture level, introducing a mathematical framework to estimate and compare the accuracy, speed, and power limits of various ADC architectures and variants. To gain system-level insight, time-interleaving is covered in detail, and a framework is also introduced to compare key metrics of interleaver architectures quantitatively. The impact of technology is also considered by adding process effects from several deep-scaled CMOS technologies.\u003cbr\u003e\u003cbr\u003eThe validity of the introduced analytical approach and the feasibility of the proposed concepts are demonstrated by four silicon prototype Integrated Circuits (ICs), realized in ultra-deep-scaled CMOS and FinFET technologies.\u003cbr\u003e\u003cbr\u003eThe book provides a comprehensive guide for researchers and engineers working in the field of high-performance ADCs, covering theoretical concepts, design methodologies, and practical implementation aspects. It offers valuable insights into the trade-offs between accuracy, speed, and power in multi-GHz ADCs and helps designers optimize their designs for optimal performance in deep-scaled CMOS technologies.\u003cbr\u003e\u003cbr\u003eOverall, this book is a valuable resource for anyone seeking to advance the state-of-the-art in ADC design and technology.\u003cbr\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp\u003e\u003cbr\u003e\u003cstrong\u003eIntroduction:\u003c\/strong\u003e\u003cbr\u003eIn recent years, there has been a significant demand for high-performance Analog-to-Digital Converters (ADC) with increasing sample rates and bandwidths. These ADCs are crucial components in various applications, such as communication systems, medical imaging, and scientific research. However, the challenges in maximizing the accuracy, speed, and power of these converters have become increasingly complex.\u003cbr\u003e\u003cbr\u003eThis book proposes innovative circuit, architecture, and system solutions in deep-scaled CMOS and FinFET technologies, which address the challenges in maximizing the accuracy, speed, and power of multi-GHz sample rate and bandwidth Analog-to-Digital Converters (ADC). A new holistic approach is introduced, which first identifies the primary error sources of converter building blocks and quantitatively analyzes their impact on the overall performance, establishing the fundamental circuit-imposed accuracy, speed, and power limits.\u003cbr\u003e\u003cbr\u003eThe analysis extends to the architecture level, introducing a mathematical framework to estimate and compare the accuracy, speed, and power limits of various ADC architectures and variants. To gain system-level insight, time-interleaving is covered in detail, and a framework is also introduced to compare key metrics of interleaver architectures quantitatively. The impact of technology is also considered by adding process effects from several deep-scaled CMOS technologies.\u003cbr\u003e\u003cbr\u003e\u003cstrong\u003eValidity of the Analytical Approach:\u003c\/strong\u003e\u003cbr\u003eThe validity of the introduced analytical approach and the feasibility of the proposed concepts are demonstrated by four silicon prototype Integrated Circuits (ICs), realized in ultra-deep-scaled CMOS and FinFET technologies. These ICs showcase the practicality of the proposed designs and validate the accuracy of the analysis.\u003cbr\u003e\u003cbr\u003e\u003cstrong\u003eNovel Methods and Techniques:\u003c\/strong\u003e\u003cbr\u003eThe book describes novel methods and techniques to push the accuracy, speed, and power boundaries of multi-GHz ADCs. It analyzes core and peripheral circuits trade-offs across the entire ADC chain, providing insights into the design considerations and optimization strategies required for high-performance ADC implementations.\u003cbr\u003e\u003cbr\u003e\u003cstrong\u003eSilicon Prototype ICs:\u003c\/strong\u003e\u003cbr\u003eThe book supports the introduced analysis and design concepts by four state-of-the-art silicon prototype ICs, implemented in 28nm bulk CMOS and 16nm FinFET technologies. These ICs demonstrate the feasibility of the proposed concepts and provide a practical reference for ADC designers.\u003cbr\u003e\u003cbr\u003e\u003cstrong\u003eConclusion:\u003c\/strong\u003e\u003cbr\u003eIn conclusion, this book presents cutting-edge circuit, architecture, and system solutions in deep-scaled CMOS and FinFET technologies, aimed at maximizing the accuracy, speed, and power of multi-GHz sample rate and bandwidth Analog-to-Digital Converters (ADC). A novel holistic approach is introduced, which first identifies the primary error sources of converter building blocks and quantitatively analyzes their impact on the overall performance. The analysis extends to the architecture level, introducing a mathematical framework to estimate and compare the accuracy, speed, and power limits of various ADC architectures and variants. To gain system-level insight, time-interleaving is covered in detail, and a framework is also introduced to compare key metrics of interleaver architectures quantitatively. The impact of technology is also considered by adding process effects from several deep-scaled CMOS technologies.\u003cbr\u003e\u003cbr\u003eThe validity of the introduced analytical approach and the feasibility of the proposed concepts are demonstrated by four silicon prototype Integrated Circuits (ICs), realized in ultra-deep-scaled CMOS and FinFET technologies. The book provides a comprehensive guide for researchers and engineers working in the field of high-performance ADCs, covering theoretical concepts, design methodologies, and practical implementation aspects. It offers valuable insights into the trade-offs between accuracy, speed, and power in multi-GHz ADCs and helps designers optimize their designs for optimal performance in deep-scaled CMOS technologies.\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eWeight\u003c\/strong\u003e: 612g\u003cbr\u003e\u003cstrong\u003eDimension\u003c\/strong\u003e: 235 x 155 (mm)\u003cbr\u003e\u003cstrong\u003eISBN-13\u003c\/strong\u003e: 9783031227080\u003cbr\u003e \u003cstrong\u003eEdition number\u003c\/strong\u003e: 1st ed. 2023\u003c\/p\u003e","brand":"Athanasios T. Ramkaj,Marcel J.M. Pelgrom,Michiel S. J. Steyaert,Filip Tavernier","offers":[{"title":"Hardback","offer_id":44302300512506,"sku":"9783031227080","price":83.29,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0522\/4297\/2845\/products\/noImage_1_d8a00122-3978-4a23-8f80-b24939d9c9d2.jpg?v=1687924539","url":"https:\/\/shulphink.com\/products\/multigigahertz-nyquist-analogtodigital-converters-architecture-and-circuit-innovations-in-deepscaled-cmos-and-finfet-technologies-9783031227080","provider":"Shulph Ink","version":"1.0","type":"link"}