{"product_id":"rf-and-timedomain-techniques-for-evaluating-novel-semiconductor-transistors-9783030777777","title":"RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors","description":"\u003cp\u003e\u003c\/p\u003e\u003cblockquote\u003e\n\u003cbr\u003eThis book provides techniques for understanding the electrical performance of novel transistors made of materials such as graphene, carbon nanotubes, and silicon-on-insulator, and using new transistor structures. It explains how to use conventional RF and time-domain measurements to characterize the performance of these transistors and how to use dynamic techniques to understand their behavior. \u003c\/blockquote\u003e\u003cp\u003e\u003cstrong\u003eFormat\u003c\/strong\u003e: Paperback \/ softback\u003cbr\u003e\u003cstrong\u003eLength\u003c\/strong\u003e: 168 pages\u003cbr\u003e\u003cstrong\u003ePublication date\u003c\/strong\u003e: 17 December 2022\u003cbr\u003e\u003cstrong\u003ePublisher\u003c\/strong\u003e: Springer Nature Switzerland AG\u003cbr\u003e\u003c\/p\u003e \u003cp\u003e\u003cbr\u003eThis comprehensive book delves into a diverse range of techniques utilizing high-frequency (RF) and time-domain measurements to unravel the intricate electrical behavior of novel, cutting-edge transistors crafted from materials like graphene, carbon nanotubes, and silicon-on-insulator. Authored by an expert in the field, it provides a detailed guide on how to employ conventional RF and time-domain measurements to thoroughly characterize the performance of these transistors. Furthermore, the book delves into the fascinating realm of novel transistor structures, exploring their potential effects, such as self-heating, period-dependent output, non-linearity, susceptibility to short-term degradation, DC-invisible structural defects, and distinct responses to DC and transient inputs.\u003cbr\u003e\u003cbr\u003eBy presenting a wealth of abstract concepts alongside practical tips and insights, the book aims to empower readers with a comprehensive understanding of the behavior of novel transistors. It sheds light on the importance of dynamic techniques in fully comprehending and characterizing these devices, emphasizing the significance of practical measurements in achieving meaningful results. Moreover, the book elucidates the relationship between these measurements and traditional, conventional DC characteristics, providing a holistic perspective on the field.\u003cbr\u003e\u003cbr\u003eThis invaluable resource is designed for researchers, engineers, and students interested in advancing their knowledge in the realm of electronic devices and transistor technology. It serves as a valuable reference for those seeking to explore the latest advancements and breakthroughs in this field. Whether you are a seasoned professional or a newcomer to the world of electronics, this book will undoubtedly enhance your understanding and proficiency in the field.\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eWeight\u003c\/strong\u003e: 285g\u003cbr\u003e\u003cstrong\u003eDimension\u003c\/strong\u003e: 235 x 155 (mm)\u003cbr\u003e\u003cstrong\u003eISBN-13\u003c\/strong\u003e: 9783030777777\u003cbr\u003e \u003cstrong\u003eEdition number\u003c\/strong\u003e: 1st ed. 2022\u003c\/p\u003e","brand":"Keith A. Jenkins","offers":[{"title":"Paperback \/ softback","offer_id":44295214203130,"sku":"9783030777777","price":45.8,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0522\/4297\/2845\/products\/noImage_1_c0994b16-5d6e-42c7-94a2-2e19a3709cb5.jpg?v=1687522190","url":"https:\/\/shulphink.com\/products\/rf-and-timedomain-techniques-for-evaluating-novel-semiconductor-transistors-9783030777777","provider":"Shulph Ink","version":"1.0","type":"link"}