{"product_id":"thermal-reliability-of-power-semiconductor-device-in-the-renewable-energy-system-9789811931314","title":"Thermal Reliability of Power Semiconductor Device in the Renewable Energy System","description":"\u003cp\u003e\u003cstrong\u003eFormat\u003c\/strong\u003e: Hardback\u003cbr\u003e\u003cstrong\u003eLength\u003c\/strong\u003e: 172 pages\u003cbr\u003e\u003cstrong\u003ePublication date\u003c\/strong\u003e: 09 July 2022\u003cbr\u003e\u003cstrong\u003ePublisher\u003c\/strong\u003e: Springer Verlag, Singapore\u003cbr\u003e\u003c\/p\u003e\u003cp\u003eThis book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management.\u003c\/p\u003e\u003cp\u003e\u003cbr\u003e\u003cstrong\u003eDimension\u003c\/strong\u003e: 235 x 155 (mm)\u003cbr\u003e\u003cstrong\u003eISBN-13\u003c\/strong\u003e: 9789811931314\u003cbr\u003e \u003cstrong\u003eEdition number\u003c\/strong\u003e: 2022 ed.\u003c\/p\u003e","brand":"Xiong Du,Jun Zhang,Gaoxian Li,Yaoyi Yu,Cheng Qian,Rui Du","offers":[{"title":"Hardback","offer_id":47425992655098,"sku":"9789811931314","price":108.28,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0522\/4297\/2845\/files\/1750419795531_book_df07acfd-a3a2-4ce9-a92e-fd71447e8ab6.jpg?v=1750534323","url":"https:\/\/shulphink.com\/products\/thermal-reliability-of-power-semiconductor-device-in-the-renewable-energy-system-9789811931314","provider":"Shulph Ink","version":"1.0","type":"link"}