Shulph Ink
Advanced Mathematical And Computational Tools In Metrology And Testing Xi
Advanced Mathematical And Computational Tools In Metrology And Testing Xi
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This volume contains original research papers on metrology and testing, presenting new modeling approaches, algorithms, and computational methods for analyzing data and evaluating measurement uncertainty. It is useful for researchers, engineers, and practitioners in characterization of measurement systems and evaluation of measurement data.
Format: Hardback
Length: 460 pages
Publication date: 14 December 2018
Publisher: World Scientific Publishing Co Pte Ltd
This comprehensive volume presents original, peer-reviewed contributions from researchers from institutions and laboratories across the globe
globe, actively engaged in metrology and testing. These papers were originally presented at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference, held at the University of Strathclyde, Glasgow, in September 2017. The conference was organized by IMEKO Technical Committee 21, the National Physical Laboratory (NPL) in the UK, and the University of Strathclyde.
The papers in this volume explore innovative modeling approaches, algorithms, and computational methods for analyzing data from metrology systems and assessing measurement uncertainty. They showcase their applications in diverse measurement domains, including engineering, environment, and life sciences. By presenting the insights of esteemed experts working at leading institutions, this volume serves as a valuable resource for all researchers, engineers, and practitioners seeking to characterize the capabilities of measurement systems and evaluate measurement data.
The papers cover the latest computational techniques and provide detailed descriptions of their applications to contemporary measurement challenges in engineering, environmental science, and life sciences. The contributions offer valuable insights and practical solutions for advancing metrology and testing practices, contributing to the development of scientific knowledge and technological advancements.
In conclusion, this volume serves as a valuable resource for researchers, engineers, and practitioners interested in metrology and testing. It provides a comprehensive overview of the latest computational approaches, applications, and challenges in the field, fostering knowledge exchange and advancing scientific research.
Weight: 788g
Dimension: 194 x 237 x 25 (mm)
ISBN-13: 9789813274297
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