Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics, Volume 226, combines two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy, covering topics such as nanomaterials characterization, cold field-emission electron sources, and electron microscopy.

Format: Hardback
Length: 284 pages
Publication date: 27 March 2023
Publisher: Elsevier Science Publishing Co Inc

Advances in Imaging and Electron Physics,Volume 226, is a groundbreaking publication that brings together two renowned serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This exceptional volume comprises a diverse range of chapters, each exploring cutting-edge topics in the field of electron physics.

In the first chapter, titled "Characterization of Nanomaterials Properties Using FE-TEM," the authors delve into the intricate process of using scanning electron microscopy (FE-TEM) to examine the properties of nanomaterials. By employing advanced imaging techniques, they gain valuable insights into the structure, morphology, and chemical composition of these tiny particles, enabling researchers to better understand their behavior and potential applications.

The second chapter, titled "Cold Field-Emission Electron Sources: From Higher Brightness to Ultrafast Beams," explores the development of cold field-emission electron sources. These sources offer significant advantages, such as high brightness, stability, and versatility, making them invaluable tools in various scientific and industrial applications. The chapter discusses the advancements in electron source design, including the use of novel materials and advanced cooling techniques, that have led to the production of ultrafast beams with exceptional temporal and spatial resolution.

In the third chapter, titled "Every Electron Counts: Towards the Development of Aberration Optimized and Aberration Corrected Electron Sources," the authors emphasize the importance of achieving high-quality electron beams in electron microscopy. Aberrations, such as spherical aberration and chromatic aberration, can significantly degrade the image quality and resolution of electron microscopes. The chapter discusses the development of aberration-optimized and aberration-corrected electron sources, including magnetic lenses, electron optics, and numerical simulations, that help mitigate these errors and enhance the imaging capabilities of electron microscopes.

The series also features several other chapters that cover a wide range of topics in electron physics. These include articles on the physics of electron devices, particularly semiconductor devices, particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics,Volume 226, is a comprehensive resource for researchers, scientists, and engineers working in the field of electron physics. With its cutting-edge research and insightful contributions, this publication provides valuable insights into the latest developments and advancements in this rapidly evolving field. Whether you are interested in nanomaterials, electron microscopy, or computing methods, this book is a must-read for anyone seeking to stay at the forefront of electron physics research.

Weight: 568g
Dimension: 158 x 239 x 23 (mm)
ISBN-13: 9780443193262