Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques

This book provides novel approaches to design for testability,debug,and reliability,using formal techniques such as SAT and BMC,to address the increasing challenges in state-of-the-art circuit designs. It combines these methods into a common framework with standardized software/hardware interfaces.

Format: Paperback / softback
Length: 164 pages
Publication date: 20 April 2022
Publisher: Springer Nature Switzerland AG

This comprehensive book delves into groundbreaking approaches to pave the way for the next generation of integrated circuits, ensuring their successful and reliable integration, even in safety-critical applications. The authors present innovative solutions to tackle the escalating challenges in design for testability, debug, and reliability, essential requirements for state-of-the-art circuit designs. By leveraging formal techniques like Satisfiability (SAT) problem and Bounded Model Checking (BMC), the book addresses the growing concerns related to the increasing volume of test data, test application time, and the demand for enhanced reliability. Thorough discussions and extensive evaluations of these methods are provided, considering industry-relevant benchmark candidates. All measures are seamlessly integrated into a unified framework, implementing standardized software/hardware interfaces.

This groundbreaking book explores innovative approaches to pave the way for the next generation of integrated circuits, ensuring their successful and reliable integration, even in safety-critical applications. The authors present groundbreaking solutions to tackle the escalating challenges in design for testability, debug, and reliability, essential requirements for state-of-the-art circuit designs. By leveraging formal techniques like Satisfiability (SAT) problem and Bounded Model Checking (BMC), the book addresses the growing concerns related to the increasing volume of test data, test application time, and the demand for enhanced reliability. Thorough discussions and extensive evaluations of these methods are provided, considering industry-relevant benchmark candidates. All measures are seamlessly integrated into a unified framework, implementing standardized software/hardware interfaces.

This comprehensive book delves into groundbreaking approaches to pave the way for the next generation of integrated circuits, ensuring their successful and reliable integration, even in safety-critical applications. The authors present innovative solutions to tackle the escalating challenges in design for testability, debug, and reliability, essential requirements for state-of-the-art circuit designs. By leveraging formal techniques like Satisfiability (SAT) problem and Bounded Model Checking (BMC), the book addresses the growing concerns related to the increasing volume of test data, test application time, and the demand for enhanced reliability. Thorough discussions and extensive evaluations of these methods are provided, considering industry-relevant benchmark candidates. All measures are seamlessly integrated into a unified framework, implementing standardized software/hardware interfaces.

Weight: 296g
Dimension: 235 x 155 (mm)
ISBN-13: 9783030692117
Edition number: 1st ed. 2021