Energy Efficient and Reliable Embedded Nanoscale SRAM Design

This reference text covers a wide range of topics related to designing robust embedded memory and peripheral circuitry, including low-power design methodologies for SRAM, radiation-hardened SRAM design for aerospace applications, and reliability issues faced by submicron technologies. It adopts a unique approach to explain SRAM bitcell, array design, and analysis, and includes a glossary, highlights, question bank, and problems. The text is suitable for senior undergraduate and graduate students, as well as professionals in electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering.

Format: Unspecified
Length: 206 pages
Publication date: 29 November 2023
Publisher: Taylor & Francis Ltd

This comprehensive reference text delves into the intricate realm of designing robust embedded memory and peripheral circuitry, catering to a wide range of disciplines. It serves as an invaluable resource for senior undergraduate and graduate students, as well as professionals, in fields such as electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering.

The text explores various aspects of low-power design methodologies for static random-access memory (SRAM), emphasizing their significance in meeting the challenges posed by submicron technologies. It also delves into the realm of radiation-hardened SRAM design, catering to the demanding requirements of aerospace applications.

Furthermore, the text addresses a range of reliability issues that arise in submicron technologies, including process variation, leakage, aging, soft errors, and related reliability concerns. It adopts a unique approach to explain the SRAM bitcell, array design, and analysis of its design parameters to overcome the sub-nano-regime challenges faced by complementary metal-oxide semiconductor devices.

The book comprehensively covers low-power-design methodologies for SRAM, showcases more stable memory topologies, and provides detailed insights into radiation-hardened SRAM design for aerospace applications. Each chapter is accompanied by a glossary, highlights, a question bank, and problems, making it an invaluable resource for students and professionals alike.

In conclusion, this reference text offers a comprehensive and in-depth exploration of designing robust embedded memory and peripheral circuitry, making it an essential resource for students, professionals, and researchers in the field.

Weight: 570g
Dimension: 234 x 156 (mm)
ISBN-13: 9781032081595