Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

The structure–property relationship in materials science and engineering is crucial for understanding behaviors. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists provides an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for analyzing crystal structures.

Format: Hardback
Length: 272 pages
Publication date: 25 April 2022
Publisher: Taylor & Francis Ltd

The structure-property relationship is a fundamental concept in materials science and engineering, as it plays a crucial role in understanding the behavior and properties of materials. To delve into this topic, the first step is to determine the crystal structure of a material, which provides insights into its internal arrangement of atoms and molecules. Various techniques, such as Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists, are employed to analyze crystal structures.

Fundamentals of Crystallography provides an introduction to the principles of crystallography, including the geometric structure of crystals, the intensity of diffracted X-ray beams, and experimental methods. It covers topics such as crystal systems, lattices, and symmetry, which are essential for understanding the structure of materials.

Powder X-ray Diffraction is a powerful technique used to analyze the crystal structure of materials. It involves bombarding a powdered sample with X-rays and measuring the diffracted X-rays to determine the crystal structure. This technique provides detailed information about the atomic arrangement and spacing within the material, which is crucial for understanding its properties.

Transmission Electron Microscopy for Materials Scientists is another technique used to analyze crystal structures. It involves using a high-resolution electron beam to scan the surface of a material and obtain images of its crystal structure. This technique provides detailed information about the atomic arrangement at the nanoscale level, which is essential for understanding the behavior of materials at the microscopic scale.

Applications of High-Resolution Transmission Electron Microscopy in Materials Research is a comprehensive guide that discusses the use of HRTEM in materials research. It covers topics such as atomic scattering factors, electron diffraction, and diffraction and phase contrasts. HRTEM provides high-resolution images of the crystal structure, which allows researchers to study the microstructure of materials and understand their properties at the atomic level.

This text, based on the course lecture notes of the authors, is designed to guide materials science and engineering students with minimal reliance on advanced mathematics. It also appeals to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering. By understanding the structure-property relationship, materials scientists and engineers can develop new materials with desired properties, such as strength, durability, and conductivity.

Weight: 660g
Dimension: 234 x 156 (mm)
ISBN-13: 9780367357948