Introduction to Spectroscopic Ellipsometry of Thin Film Materials - Instrumentation, Data Analysis and Applications

Spectroscopic ellipsometry is a traditional experimental technique used to characterize the intrinsic properties of novel materials. This book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. It includes thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, comprehensive explorations of two-dimensional transition metal dichalcogenides, practical discussions of single-layer graphene systems and nickelate systems, and in-depth examinations of potential future developments and applications of spectroscopic ellipsometry. Perfect for masters- and PhD-level students in physics and chemistry, this book will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.

Format: Paperback / softback
Length: 208 pages
Publication date: 13 April 2022
Publisher: Wiley-VCH Verlag GmbH

In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a comprehensive exploration of the utilization of spectroscopic ellipsometry for novel material characterization is presented. A team of esteemed researchers delves into the intricate details of how this traditional experimental technique is employed to unravel the intrinsic properties of diverse materials. The book specifically focuses on the scientifically and technologically significant two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides such as manganite materials, and unconventional superconductors, including copper oxide systems.

The distinguished authors engage in a detailed discussion of the characterization of various properties, encompassing electronic structures, interfacial properties, and the ensuing quasiparticle dynamics in novel quantum materials. Alongside illustrative and specific case studies highlighting the application of spectroscopic ellipsometry to investigate the optical and quasiparticle characteristics of innovative systems, the book encompasses:

Thorough introductions to the fundamental principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites.
Comprehensive explorations of two-dimensional transition metal dichalcogenides.
Practical discussions of single-layer graphene systems and nickelate systems.
In-depth examinations of potential future developments and applications of spectroscopic ellipsometry.

Ideal for advanced students pursuing degrees in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also find a prominent place in the libraries of materials science enthusiasts seeking a comprehensive reference for the applications of spectroscopic ellipsometry to novel developed materials.

Weight: 408g
Dimension: 249 x 169 x 12 (mm)
ISBN-13: 9783527349517