Ion Beam Induced Defects and Their Effects in Oxide Materials

This book provides an overview of the applications of ion beam techniques in oxide materials, which are important for sensing, optoelectronics, and spintronics. It highlights the importance of understanding defects in these materials, and ion beam tools are considered the most effective techniques for creating controlled defects.

Format: Paperback / softback
Length: 61 pages
Publication date: 24 February 2022
Publisher: Springer Nature Switzerland AG

This comprehensive book delves into the diverse applications of ion beam techniques in oxide materials, which are characterized by their defect-induced physical properties. These properties hold significant importance in fields such as sensing, optoelectronics, and spintronics. Moreover, defects in oxide materials can induce magnetism in non-magnetic materials or alter the magnetic ordering in magnetic materials, making a thorough understanding of these defects paramount.

In the realm of oxide materials, ion beam tools have emerged as the most effective techniques for creating controlled defects. These tools allow for precise manipulation and modification of the material's structure, enabling the introduction of desired impurities or defects. By employing ion beams, researchers can engineer oxides with tailored properties that enhance their performance in various applications.

The book will provide a detailed account of the ion beam tools utilized for creating defects in oxides. It will cover the various ion beam sources, such as plasma sources, electron beam sources, and ion implantation systems, and their applications in defect creation. The book will also discuss the techniques used to control the ion beam parameters, such as energy, dose, and beam direction, to achieve the desired defect characteristics.

Furthermore, the book will explore the impact of defects on the physical properties of oxide materials. It will discuss the formation of new electronic states, changes in electrical conductivity, and modifications in optical properties due to defect introduction. The book will also examine the role of defects in the development of new oxide-based devices, such as sensors, transistors, and magnetic materials.

In conclusion, this book offers a comprehensive and in-depth exploration of the applications of ion beam techniques in oxide materials. It provides a valuable resource for researchers, engineers, and students interested in advancing the field of oxide materials science and technology. By detailing the ion beam tools utilized for creating defects in oxides, the book enables readers to gain a deeper understanding of the underlying principles and enables the development of innovative oxide-based devices for a wide range of applications.

Weight: 131g
Dimension: 235 x 155 (mm)
ISBN-13: 9783030938611
Edition number: 1st ed. 2022