Principles of Materials Characterization and Metrology

Characterization is essential for predicting materials' macroscopic behavior. It involves understanding bonding, electronic structure, and atom arrangement in crystals. Techniques such as X-ray, electron, and neutron diffraction, as well as scanning electron microscopy and scanning probe microscopies, are used to analyze materials. This book combines physical principles and practical applications to explain and illustrate the fundamental properties of materials.

Format: Paperback / softback
Length: 880 pages
Publication date: 07 May 2021
Publisher: Oxford University Press

Characterization is a crucial tool that enables us to gain a microscopic understanding of the fundamental properties of materials, paving the way for predicting their macroscopic behavior in fields such as engineering. In Principles of Materials Characterization and Metrology, we delve into the realm of materials characterization and metrology, providing a comprehensive exploration of the principles and techniques involved.

To begin, we introduce the fundamental concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. These concepts serve as the foundation for understanding the various characterization techniques that follow.

Next, we explore the wide range of electrons, photons, ions, neutrons, and scanning probes used in characterization. We discuss their generation mechanisms, as well as the beam-solid interactions that determine or limit their use. This includes a detailed examination of ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry, which are essential tools in our understanding of materials.

Furthermore, we generalize the Fraunhofer diffraction principle to scattering by a three-dimensional arrangement of atoms in crystals, leading to the development of X-ray, electron, and neutron diffraction methods. These methods provide valuable insights into the internal structure and properties of materials, both from surfaces and within the bulk.

The discussion continues with chapters on transmission and analytical electron microscopy, including recent developments in these fields. We explore the techniques used to examine materials at the nanoscale, including scanning electron microscopy and scanning probe microscopies, which offer unique perspectives on the structure and behavior of materials.

To summarize the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout the book, we conclude with elaborate tables that provide a convenient and easily accessible way of summarizing the material.

Principles of Materials Characterization and Metrology is a comprehensive resource that combines a discussion of the physical principles and practical application of these characterization techniques. Drawing on forty years of teaching and research experience, the book incorporates worked exam questions to reinforce the understanding of the material.

In conclusion, characterization is a fundamental tool that enables us to gain a deeper understanding of the properties of materials. Principles of Materials Characterization and Metrology provides a comprehensive and practical guide to the principles and techniques of materials characterization and metrology, equipping readers with the knowledge and skills necessary to explore and analyze the fundamental properties of a wide range of materials.

Weight: 1896g
Dimension: 189 x 248 x 47 (mm)
ISBN-13: 9780198830269