Joseph B.Bernstein,AlainBensoussan,EmmanuelBender
Reliability Prediction for Microelectronics
Reliability Prediction for Microelectronics
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This book provides a comprehensive guide to reliability assessment for microelectronics, covering topics such as failure foundation, reliability testing, and acceleration factor calculation. It is ideal for reliability and quality engineers, design engineers, and advanced engineering students.
Format: Hardback
Length: 400 pages
Publication date: 21 March 2024
Publisher: John Wiley & Sons Inc
Reliability prediction for microelectronics is a crucial aspect of engineering, as it ensures safe performance within desired parameters over the lifespan of machines. With the increasing prominence of nano-scale microelectronic devices in modern life, it has become essential to understand the tools available to evaluate reliability. Wiley Series in Quality & Reliability Engineering's book, "Reliability Prediction for Microelectronics," revolutionizes the approach to reliability assessment by providing a comprehensive set of tools built around principles of reliability physics and the concept of remaining useful life (RUL).
The book takes as its core subject the "physics of failure," combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing.
The book focuses on the tools required to perform reliability assessments in real operating conditions, with detailed discussions of topics such as failure foundation, reliability testing, acceleration factor calculation, and more. It also includes new multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI.
"Reliability Prediction for Microelectronics" is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area. Its comprehensive coverage and practical approach make it a valuable resource for anyone involved in microelectronics reliability assessment.
Weight: 709g
Dimension: 235 x 201 x 28 (mm)
ISBN-13: 9781394210930
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