Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022, Proceedings

This book presents the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2022, held in Montreal, QC, Canada, in August 2022. It includes 30 papers and 2 invited talks, covering topics such as deep learning, processing, computer vision, machine learning, and pattern recognition.

Format: Paperback / softback
Length: 324 pages
Publication date: 02 January 2023
Publisher: Springer International Publishing AG

The book is a compilation of the proceedings from the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2022, which took place in Montreal, QC, Canada, in August 2022. The workshop featured a total of 30 papers, along with 2 invited talks, which were meticulously reviewed and selected from a pool of 50 submissions. The diverse range of topics covered in the workshop included deep learning, processing, computer vision, machine learning, and pattern recognition, among many others.

The papers presented at the workshop covered a wide spectrum of research areas, showcasing the latest advancements and innovations in the field of pattern recognition. Some of the key themes explored included neural networks, convolutional neural networks, recurrent neural networks, and transfer learning. The authors presented their findings and discussed their methodologies, highlighting the potential applications of these techniques in various domains such as image processing, natural language processing, and medical diagnosis.

Another notable aspect of the workshop was the presence of invited talks by renowned experts in the field. These talks provided insights into the latest trends, challenges, and opportunities in pattern recognition, and helped to foster interdisciplinary collaboration among researchers from different domains.

Overall, the book serves as a valuable resource for researchers, practitioners, and students interested in structural, syntactic, and statistical pattern recognition. It provides a comprehensive overview of the latest research developments and highlights the potential applications of these techniques in a wide range of fields.

Weight: 522g
Dimension: 235 x 155 (mm)
ISBN-13: 9783031230271
Edition number: 1st ed. 2022