Surface-Ionization Drift-Spectrometry

Surface-Ionization Drift-Spectrometry is a new method that combines a surface-ionization source and a drift spectrometer to detect organic molecules in a single instrument. It can identify multiple parameters for electronic materials and devices, including TFIMS and FAIMS, and offers greater multi-parameter identification, selectivity, and resistance to fluctuations in humidity.

Format: Hardback
Length: 304 pages
Publication date: 05 July 2022
Publisher: Taylor & Francis Ltd

Surface-Ionization Drift-Spectrometry is a groundbreaking method that employs surface ionization to analyze nitrogen-, phosphorus-, arsenic- and sulfur-containing organics. It introduces novel theoretical approaches that seamlessly integrate a surface-ionization source with a drift spectrometer of coaxial design, enabling the simultaneous detection of multiple parameters in a single instrument. This comprehensive reference delves into various versions of the device and the model set of nitrogen, phosphorus, arsenic, and sulfur-containing organics, resulting in the successful identification of three to seven independent parameters. The authors showcase the versatility of the methods in identifying various parameters for electronic materials and devices.

Furthermore, this reference highlights additional features, including:

Demonstration of a novel approach to Time-of-Flight Ion Mobility Spectrometry (TFIMS).
Exploration of alternative methods for High-field Asymmetric Waveform Ion Mobility Spectrometry (FAIMS).
Offers readers enhanced multi-parameter identification, selectivity, and resistance to fluctuations in humidity.

By leveraging surface ionization and drift spectrometry, Surface-Ionization Drift-Spectrometry provides a powerful tool for the comprehensive analysis of organic compounds, offering significant advancements in analytical precision and efficiency.

Dimension: 234 x 156 (mm)
ISBN-13: 9780367493752