Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation

This book provides a comprehensive guide to exploring the inner workings of atomic force microscopy (AFM), covering mechatronic system topics such as mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, and controller. It emphasizes novel development of active cantilever probes with embedded transducers and includes practical examples for AFM subsystem level design. Additionally, it offers a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit for curriculum development. The materials presented are widely applicable to precision mechatronic system design in upper-level graduate courses.

Format: Hardback
Length: 366 pages
Publication date: 07 February 2024
Publisher: Springer International Publishing AG

This comprehensive book serves as a valuable guide for readers seeking to delve into the intricate details of atomic force microscopy (AFM). Providing a comprehensive perspective on precision instrumentation, it offers a systematic exploration of the inner workings of AFM. Spanning a wide range of mechatronic system topics, the book encompasses mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller, and more. With a strong theoretical foundation, practical examples are provided for designing AFM subsystems at the nano-positioning system, cantilever probe, control system, and system integration levels.

One of the key highlights of this book is its emphasis on the novel development of active cantilever probes with embedded transducers. This innovative approach empowers AFM with new capabilities, making it suitable for advanced applications. Detailed design specifications of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are also provided, enabling instructors to effectively utilize this book for curriculum development.

The primary objective of this book is to empower AFM users with a deeper understanding of the instrument, enabling them to extend its functionalities for advanced state-of-the-art research studies. Beyond AFM, the materials presented herein have broad applications to precision mechatronic system design, which is covered in numerous upper-level graduate courses in mechanical and electrical engineering. By nurturing the next generation of instrumentalists, this book plays a crucial role in advancing the field of precision instrumentation.

Weight: 823g
Dimension: 235 x 155 (mm)
ISBN-13: 9783031442322
Edition number: 1st ed. 2024