Ch SateeshKumar,M. MuralidharSingh,RamKrishna
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
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- More about Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Format: Hardback
Length: 130 pages
Publication date: 04 May 2023
Publisher: Taylor & Francis Ltd
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
Weight: 346g
Dimension: 161 x 241 x 14 (mm)
ISBN-13: 9781032375106
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