Ch SateeshKumar,M. MuralidharSingh,RamKrishna
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
💎 Earn 323 Points (£3.23) on this item.
- Condition: Brand new
- UK Delivery times: Usually arrives within 2 - 3 working days
- UK Shipping: Fee starts at £3.89. Subject to product weight & dimension
Bulk ordering. Want 15 or more copies? Get a personalised quote and bigger discounts. Learn more about bulk orders.
Couldn't load pickup availability
- More about Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Format: Paperback / softback
Length: 130 pages
Publication date: 29 November 2024
Publisher: Taylor & Francis Ltd
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
Weight: 267g
Dimension: 234 x 156 (mm)
ISBN-13: 9781032375113
UK and International shipping information
UK and International shipping information
We deliver throughout the United Kingdom and to 128 countries and territories worldwide, including the United States, Australia, Canada, Germany, Spain and France.
