Shulph Ink
Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
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- More about Advanced VLSI Design and Testability Issues
This book provides a comprehensive overview of VLSI design, covering topics such as FPGA, digital design, advanced FET structures, application-specific techniques, testability, and hardware obfuscation. It is suitable for VLSI-interested individuals and professionals seeking to gain in-depth knowledge and expertise in this field.
This book provides a comprehensive overview of VLSI design, covering topics such as FPGA, digital design, advanced FET structures, application-specific techniques, testability, and hardware obfuscation. It is suitable for VLSI-interested individuals and professionals seeking to gain in-depth knowledge and expertise in this field.
Format: Paperback / softback
Length: 360 pages
Publication date: 15 April 2022
Publisher: Taylor & Francis Ltd
This comprehensive book caters to individuals with a keen interest in VLSI, providing them with not only a deep understanding of the field but also a broad perspective on its applications across various domains, including image processing and biomedical sciences. By elucidating the fundamentals of VLSI in simple language, the book empowers readers to develop innovative applications while also emphasizing the significance of hardware description languages in designing complex circuits.
In the realm of VLSI, the importance of hardware description languages cannot be overstated, as designing intricate and dense circuits is a formidable challenge that requires their utilization. Both Verilog and VHDL languages are employed in this book for designing purposes.
The most captivating aspect of this book lies in its exploration of the current needs of high-performance integrated circuits (ICs), encompassing low-power devices and emerging materials that hold immense potential for achieving novel functionalities. These advancements are particularly significant in the era of nanotechnology, where the development of VLSI circuits has become increasingly crucial.
In this nanometer technology era, the testing of VLSI circuits assumes paramount importance, surpassing the significance of their design. Fault simulation algorithms play a pivotal role in this regard, and the book provides a comprehensive explanation of their implementation using Verilog.
The book is meticulously organized into 20 chapters, each dedicated to a specific aspect of VLSI. Chapter 1 highlights the applications of FPGA in various image processing and biomedical domains, providing a foundational understanding of digital design through the lens of HDL. Chapters 2 to 5 delve into the basics of digital design, covering topics such as logic gates, flip-flops, and sequential circuits. Chapters 6 and 7 focus on enhancing the performance of silicon-based FET designs through alternative material or geometry considerations. Chapters 8 and 9 explore the study of bimolecular interactions with biosensing FETs, shedding light on their potential applications in healthcare. Chapters 10 to 13 delve into advanced FET structures, including nanowires, high-frequency FETs (HFETs), and their comparative analysis in terms of device performance metrics calculation.
In conclusion, this book serves as a valuable resource for individuals seeking to expand their knowledge and expertise in VLSI. Its comprehensive coverage of topics, coupled with its simple language and practical examples, makes it accessible to a wide range of readers, including students, researchers, and professionals in the field. By providing a deep understanding of VLSI concepts and their applications, this book empowers readers to contribute to the ongoing advancements in this rapidly evolving technology.
Dimension: 234 x 156 (mm)
ISBN-13: 9780367538361
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