Shulph Ink
In-Situ Transmission Electron Microscopy
In-Situ Transmission Electron Microscopy
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- More about In-Situ Transmission Electron Microscopy
Format: Hardback
Length: 371 pages
Publication date: 08 February 2023
Publisher: Springer Verlag, Singapore
This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a sample’s response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time.
Dimension: 235 x 155 (mm)
ISBN-13: 9789811968440
Edition number: 2023 ed.
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