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Jon Duncan Hagar

IoT System Testing: An IoT Journey from Devices to Analytics and the Edge

IoT System Testing: An IoT Journey from Devices to Analytics and the Edge

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  • More about IoT System Testing: An IoT Journey from Devices to Analytics and the Edge


This book discusses the Internet of Things (IoT) from a quality testing perspective, covering test planning, strategy, security testing, software test labs, architecture, and AI. It guides start-up and experienced teams to improve the testing and quality assessment of IoT systems, considering the criticality of software and risks involved.

Format: Paperback / softback
Length: 326 pages
Publication date: 20 August 2022
Publisher: APress


The Internet of Things (IoT) is a rapidly growing technology that is transforming the way we live and work. To ensure the success of IoT systems, it is essential to assure their quality. This book takes a comprehensive look at IoT from a quality testing perspective, covering topics such as IoT, verification and validation (V&V), and testing.

The first chapter provides an introduction to IoT, V&V, and testing. It explains what IoT is, how it works, and the challenges associated with testing it. The chapter also discusses the importance of data analytics and AI in IoT testing and how they can be used to improve the quality of systems.

The second chapter focuses on IoT test planning and strategy. It covers the entire life cycle of IoT testing, from requirements gathering to deployment and maintenance. The chapter also discusses the impact of data analytics and AI on test planning and strategy and how they can be used to optimize testing efforts.

The third chapter delves deeper into IoT security testing and various test techniques, patterns, and more. It covers topics such as vulnerability assessment, penetration testing, and security testing of IoT devices and networks. The chapter also discusses the need for IoT security, data analytics, AI, neural networks, and dependability using testing and V&V.

The fourth chapter examines IoT software test labs, architecture, environments, and AI. It covers the setup and configuration of IoT test labs, the architecture of IoT systems, the environments in which they operate, and the role of AI in testing and V&V.

The fifth chapter discusses the options for testing IoT qualities based on the criticality of the software and the risks involved. It covers topics such as black box testing, white box testing, and grey box testing and their respective advantages and disadvantages. The chapter also discusses the cost and schedule impacts of each testing option.

The final chapter provides guidance for start-up and experienced teams on improving the testing and quality assessment of IoT systems. It covers topics such as test automation, test data management, and test reporting and how they can be used to streamline testing efforts and improve the accuracy of test results.

This book is designed for readers with basic knowledge of software development who want to learn more about IoT testing and its intricacies. It is also useful for companies moving into the domain of IoT and even those already deep into the IoT domain. The book provides a comprehensive and up-to-date overview of IoT testing and its challenges, and it offers practical tips and techniques for improving the quality of IoT systems.

Weight: 662g
Dimension: 254 x 178 (mm)
ISBN-13: 9781484282755
Edition number: 1st ed.

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