Sheldon Tan,Mehdi Tahoori,Taeyoung Kim,Shengcheng Wang,Zeyu Sun,Saman Kiamehr
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
💎 Earn 536 Points (£5.36) on this item.
We can order this item for you. Delivery usually takes about 4 to 6 weeks.
This item is not held in our immediate stock. We will order it for you after checkout.
Estimated delivery: About 4 to 6 weeks
YOU SAVE £22.62
- Condition: Brand new
- UK Delivery times: Usually arrives within 2 - 3 working days
- UK Shipping: Fee starts at £3.89. Subject to product weight & dimension
Bulk ordering. Want 15 or more copies? Get a personalised quote and bigger discounts. Learn more about bulk orders.
Couldn't load pickup availability
- More about Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Format: Paperback / softback
Length: 460 pages
Publication date: 25 September 2020
Publisher: Springer Nature Switzerland AG
Weight: 765g
Dimension: 235 x 155 (mm)
ISBN-13: 9783030261740
Edition number: 1st ed. 2019
UK and International shipping information
UK and International shipping information
We deliver throughout the United Kingdom and to 128 countries and territories worldwide, including the United States, Australia, Canada, Germany, Spain and France.
