Gunturi Venkata Sitarama Sastry
Microstructural Characterisation Techniques
Microstructural Characterisation Techniques
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Excellent- More about Microstructural Characterisation Techniques
Format: Paperback / softback
Length: 242 pages
Publication date: 17 September 2023
Publisher: Springer Verlag, Singapore
It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy.
Dimension: 235 x 155 (mm)
ISBN-13: 9789811935114
Edition number: 1st ed. 2022
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