Tapan K. Sarkar,Magdalena Salazar-Palma,Ming Da Zhu,Heng Chen
Modern Characterization of Electromagnetic Systems and its Associated Metrology
Modern Characterization of Electromagnetic Systems and its Associated Metrology
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- More about Modern Characterization of Electromagnetic Systems and its Associated Metrology
Format: Hardback
Length: 720 pages
Publication date: 24 August 2021
Publisher: John Wiley and Sons Ltd
Weight: 1270g
Dimension: 488 x 203 x 41 (mm)
ISBN-13: 9781119076469
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