John C. Stover
Optical Scattering: Measurement and Analysis
Optical Scattering: Measurement and Analysis
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- More about Optical Scattering: Measurement and Analysis
Format: Paperback / softback
Length: 368 pages
Publication date: 19 September 2025
Publisher: SPIE Press
Exploring the link between surface roughness and light scatter, the text connects BRDF and fractional scatter to rapid product inspection. It explains how scatterometry detects semiconductor defects and appearance variations in everyday items, offering practical methods for swift quality control.
ISBN-13: 9781510690288
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