Behnam Ghavami,Mohsen Raji
Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
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- More about Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
Format: Paperback / softback
Length: 114 pages
Publication date: 14 October 2021
Publisher: Springer Nature Switzerland AG
Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Weight: 209g
Dimension: 235 x 155 (mm)
ISBN-13: 9783030516123
Edition number: 1st ed. 2021
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